Thomas Listerman

A Useful and Challenging Take-Home Examination: Characterization of an Imaginary Semiconductor Sample
Listerman, T. W., Aug 1994, In: IEEE Transactions on Education. 37, 3, p. 319-321 3 p.
Research output: Contribution to journal › Article › peer-review
Cooling by immersion in liquid nitrogen
Listerman, T. W., Boshinski, T. A. & Knese, L. F., Jun 1 1986, In: American Journal of Physics. 54, 6, p. 554-558 5 p.
Research output: Contribution to journal › Article › peer-review

Open Access
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Determining the temperature-dependent characteristic temperature of beryllium from electrical resistance measurements
Listerman, T. W. & Zhou, X., May 1 1985, In: American Journal of Physics. 53, 5, p. 460-463 4 p.
Research output: Contribution to journal › Article › peer-review

Open Access
File
DIRECT MEASUREMENT OF THE SUBSURFACE HYDROGEN BARRIER LAYER IN PLASMA-TREATED SILICON RIBBON.
Jaworowski, A. E., Wielunski, L. S. & Listerman, T. W., 1985, Materials Research Society Symposia Proceedings. Materials Research Soc, p. 561-565 5 p. (Materials Research Society Symposia Proceedings; vol. 46).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
A simple method for calculating Debye heat capacity values using the Einstein heat capacity formula
Listerman, T. W. & Ross, C. B., Sep 1979, In: Cryogenics. 19, 9, p. 547-549 3 p.
Research output: Contribution to journal › Article › peer-review

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