280-GHz Schottky Diode Detector in 130-NM Digital CMOS

Ruonan Han, Yaming Zhang, Dominique Coquillat, Julie Hoy, Hadley Videlier, Wojciech Knap, Elliott Brown, K. O. Kenneth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A 2×2 array of Schottky-barrier diode detectors with an on-chip patch antenna and a preamplifier is fabricated in a 130-nm logic CMOS process. Each detector cell can detect the 25-kHz modulated 280-GHz radiation signal with a measured responsivity and noise equivalent power (NEP) of 21kV/W and 360pW/ √Hz, respectively. At 4-MHz modulation frequency, NEP should be about 40pW/ √Hz. At supply voltage of 1.2V, the detector consumes 1.6mW. By utilizing the detector, a millimeter-wave image is constructed, demonstrating its potential application in millimeter-wave and THz imaging.
Original languageEnglish
Title of host publicationIEEE Custom Integrated Circuits Conference 2010, CICC 2010
Number of pages4
DOIs
StatePublished - 2010
Externally publishedYes
Event32nd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2010 - San Jose, CA, United States
Duration: Sep 19 2010Sep 22 2010

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Conference

Conference32nd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2010
Country/TerritoryUnited States
CitySan Jose, CA
Period9/19/109/22/10

ASJC Scopus Subject Areas

  • Electrical and Electronic Engineering

Keywords

  • Condensed matter
  • Detectors
  • Diodes
  • Electric currents
  • Electromotive force
  • Electronic circuits
  • Electronics
  • Electrostatics
  • Imaging
  • Integrated circuits
  • Logic
  • Materials science
  • Noise
  • Physics

Disciplines

  • Physics
  • Electrical and Computer Engineering

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