A First Study of the Effect of Surface Roughness in Additive-Manufactured Copper at THz Frequencies

Tomas Di Fulvio, Elliott R. Brown, Andrew J. Huebner, Michael A. Saville, Paul Sotirelis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The surface roughness of additive-manufactured copper is characterized by profilometry, and its effect on the THz reflectance is measured at 600 GHz. A strong specular component is measured, as well as a non-specular component displaying fluctuations in the wings of the angular reflectance plot.
Original languageEnglish
Title of host publicationNAECON 2023 - IEEE National Aerospace and Electronics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages138-140
Number of pages3
ISBN (Electronic)9798350338782
DOIs
StatePublished - 2023
Event2023 IEEE National Aerospace and Electronics Conference, NAECON 2023 - Dayton, United States
Duration: Aug 28 2023Aug 31 2023

Publication series

NameProceedings of the IEEE National Aerospace Electronics Conference, NAECON
ISSN (Print)0547-3578
ISSN (Electronic)2379-2027

Conference

Conference2023 IEEE National Aerospace and Electronics Conference, NAECON 2023
Country/TerritoryUnited States
CityDayton
Period8/28/238/31/23

ASJC Scopus Subject Areas

  • Computer Networks and Communications
  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Keywords

  • Additive manufactured copper
  • roughness parameters and statistics
  • specular and non-specular reflectance
  • THz reflectometry

Cite this