TY - GEN
T1 - A First Study of the Effect of Surface Roughness in Additive-Manufactured Copper at THz Frequencies
AU - Di Fulvio, Tomas
AU - Brown, Elliott R.
AU - Huebner, Andrew J.
AU - Saville, Michael A.
AU - Sotirelis, Paul
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - The surface roughness of additive-manufactured copper is characterized by profilometry, and its effect on the THz reflectance is measured at 600 GHz. A strong specular component is measured, as well as a non-specular component displaying fluctuations in the wings of the angular reflectance plot.
AB - The surface roughness of additive-manufactured copper is characterized by profilometry, and its effect on the THz reflectance is measured at 600 GHz. A strong specular component is measured, as well as a non-specular component displaying fluctuations in the wings of the angular reflectance plot.
KW - Additive manufactured copper
KW - roughness parameters and statistics
KW - specular and non-specular reflectance
KW - THz reflectometry
UR - https://www.scopus.com/pages/publications/85182394881
UR - https://www.scopus.com/inward/citedby.url?scp=85182394881&partnerID=8YFLogxK
U2 - 10.1109/NAECON58068.2023.10366006
DO - 10.1109/NAECON58068.2023.10366006
M3 - Conference contribution
AN - SCOPUS:85182394881
T3 - Proceedings of the IEEE National Aerospace Electronics Conference, NAECON
SP - 138
EP - 140
BT - NAECON 2023 - IEEE National Aerospace and Electronics Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE National Aerospace and Electronics Conference, NAECON 2023
Y2 - 28 August 2023 through 31 August 2023
ER -