A High Signal-to-Noise Ratio, Coherent, Frequency-Domain THz Spectrometer Employed To Characterize Explosive Compounds

Joseph R. Demers, Ronald T. Logan, Normand J. Bergeron, Elliott R. Brown

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A compact terahertz frequency domain spectrometer realized through photo-mixing of two distributed feedback (DFB) diode lasers in ErAs:GaAs is shown to have a signal-to-noise ratio of 80 dB*Hz at 200 GHz and 60 dB*Hz at 1 THz. Continuous frequency sweeping is demonstrated with better than 1 GHz resolution from 200 GHz to 1.85 THz. The system is employed for the characterization of several explosives.
Original languageEnglish
Title of host publication33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
DOIs
StatePublished - 2008
Externally publishedYes
Event33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008 - Pasadena, CA, United States
Duration: Sep 15 2008Sep 19 2008

Publication series

Name33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008

Conference

Conference33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
Country/TerritoryUnited States
CityPasadena, CA
Period9/15/089/19/08

ASJC Scopus Subject Areas

  • Electrical and Electronic Engineering

Keywords

  • Laser beams
  • Frequency domain analysis
  • Detectors
  • Explosives
  • Semiconductor lasers
  • Distributed feedback devices
  • Signal to noise ratio
  • Terahertz Spectometer

Disciplines

  • Optics
  • Semiconductor and Optical Materials

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