A Two-Layer Magneto-TLM Contact Resistance Model: Application to Modulation-Doped FET Structures

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	133-138
Number of pages	6
Journal	IEEE Transactions on Electron Devices
Volume	35
Issue number	2
DOIs	https://doi.org/10.1109/16.2431
State	Published - Feb 1988

ASJC Scopus Subject Areas

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author = "Look, {David C.}",

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