A Useful and Challenging Take-Home Examination: Characterization of an Imaginary Semiconductor Sample

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	319-321
Number of pages	3
Journal	IEEE Transactions on Education
Volume	37
Issue number	3
DOIs	https://doi.org/10.1109/13.312146
State	Published - Aug 1994
Externally published	Yes

ASJC Scopus Subject Areas

@article{a86cc0d6c6a042998ac8d33c157cde4f,

title = "A Useful and Challenging Take-Home Examination: Characterization of an Imaginary Semiconductor Sample",

author = "Listerman, {Thomas W.}",

year = "1994",

month = aug,

doi = "10.1109/13.312146",

language = "English",

volume = "37",

pages = "319--321",

journal = "IEEE Transactions on Education",

issn = "0018-9359",

number = "3",

}

TY - JOUR

T1 - A Useful and Challenging Take-Home Examination

T2 - Characterization of an Imaginary Semiconductor Sample

AU - Listerman, Thomas W.

PY - 1994/8

Y1 - 1994/8

UR - http://www.scopus.com/inward/record.url?scp=0028485186&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028485186&partnerID=8YFLogxK

U2 - 10.1109/13.312146

DO - 10.1109/13.312146

M3 - Article

AN - SCOPUS:0028485186

SN - 0018-9359

VL - 37

SP - 319

EP - 321

JO - IEEE Transactions on Education

JF - IEEE Transactions on Education

IS - 3

ER -