@inproceedings{5906387e584b42fdbffb84f9911eed91,
title = "AC Conductivity Parameters of Graphene Films With THz Spectroscopy",
abstract = "The complex conductivity of CVD-grown graphene films between 0.1 and 1.6 THz are obtained using a non-destructive THz etalon transmittance technique. Critical parameters such as ionized-impurity scattering width and chemical potential are derived. The technique can be extended to extract the complex ac conductivity parameters of other thin conducting films or 2DEG materials with high sheet conductance.",
keywords = "2D, Conductivity, Graphene, THz, Transmittance, AC Conductivity, Army Research Laboratory, Army Research Office, Sheet Resistance, Dielectric Constant, Fitting Parameters, 2D Materials, Reflection Coefficient, Transmission Coefficient, Substrate Thickness, Beam Path, 2D Films, Tetrahertz spectroscopy, Optics, Optics and photonics",
author = "Zhang, \{W. D.\} and Brown, \{E. R.\} and Pham, \{Phi H.O.\} and P. Burke",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; IEEE National Aerospace and Electronics Conference, NAECON 2014 ; Conference date: 24-06-2014 Through 27-06-2014",
year = "2015",
month = feb,
day = "19",
doi = "10.1109/NAECON.2014.7045824",
language = "English",
series = "National Aerospace and Electronics Conference, Proceedings of the IEEE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "310--312",
booktitle = "2014 IEEE National Aerospace and Electronics Conference, NAECON 2014",
}