@article{89cd254a81944068be8711c72de66fe5,
title = "Accurate measurement of capture cross sections in deep level transient spectroscopy: Application to EL2 in GaAs",
keywords = "Capture cross section, deep level transient spectroscopy (DLTS), EL2, GaAs",
author = "Look, \{D. C.\} and Fang, \{Z. Q.\} and Sizelove, \{J. R.\}",
year = "1995",
month = oct,
doi = "10.1007/BF02655464",
language = "English",
volume = "24",
pages = "1461--1464",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
number = "10",
}