Analytical two-layer Hall analysis: Application to modulation-doped field-effect transistors

D. C. Look; C. E. Stutz; C. A. Bozada

doi:10.1063/1.354109

Analytical two-layer Hall analysis: Application to modulation-doped field-effect transistors

D. C. Look, C. E. Stutz, C. A. Bozada

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	311-314
Number of pages	4
Journal	Journal of Applied Physics
Volume	74
Issue number	1
DOIs	https://doi.org/10.1063/1.354109
State	Published - 1993

ASJC Scopus Subject Areas

General Physics and Astronomy

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AU - Bozada, C. A.

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Analytical two-layer Hall analysis: Application to modulation-doped field-effect transistors

ASJC Scopus Subject Areas

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