Anomalies in annealed LT-GaAs samples

Z. Liliental-Weber; K. M. Yu; J. Washburn; D. C. Look

doi:10.1007/BF02649984

Anomalies in annealed LT-GaAs samples

Z. Liliental-Weber, K. M. Yu, J. Washburn, D. C. Look

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1395-1399
Number of pages	5
Journal	Journal of Electronic Materials
Volume	22
Issue number	12
DOIs	https://doi.org/10.1007/BF02649984
State	Published - Dec 1993

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

Keywords

Low-temperature-grown GaAs
MBE
precipitation
TEM

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10.1007/BF02649984

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title = "Anomalies in annealed LT-GaAs samples",

keywords = "Low-temperature-grown GaAs, MBE, precipitation, TEM",

author = "Z. Liliental-Weber and Yu, \{K. M.\} and J. Washburn and Look, \{D. C.\}",

year = "1993",

month = dec,

doi = "10.1007/BF02649984",

language = "English",

volume = "22",

pages = "1395--1399",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

number = "12",

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T1 - Anomalies in annealed LT-GaAs samples

AU - Liliental-Weber, Z.

AU - Yu, K. M.

AU - Washburn, J.

AU - Look, D. C.

PY - 1993/12

Y1 - 1993/12

KW - Low-temperature-grown GaAs

KW - MBE

KW - precipitation

KW - TEM

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DO - 10.1007/BF02649984

M3 - Article

AN - SCOPUS:0027866957

SN - 0361-5235

VL - 22

SP - 1395

EP - 1399

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 12

ER -

Anomalies in annealed LT-GaAs samples

ASJC Scopus Subject Areas

Keywords

Access to Document

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