Abstract
A photoreflectance (PR) and photoluminescence (PL) study has been performed on a Si-doped epitaxial GaN layer that contains impurity or defect related below band gap features in its PR spectrum. In the 300 K PR spectrum, these features appear at energies of 3.26 and 3.33 eV, respectively, but below 180 K they can no longer be seen. The 3.26 eV line evidently corresponds to a donor acceptor pair transition, also seen in PL. The origin of the 3.33 eV line is uncertain, but may correspond to a transition involving the nitrogen vacancy.
Original language | American English |
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Pages (from-to) | 1931-1933 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 11 |
DOIs | |
State | Published - Sep 13 2004 |
Keywords
- Doping
- Excitons
- Photons
- Epitaxy
- Mechanical stress
- Semiconductor materials
- Photoluminescence spectroscopy
- Vapor phase deposition
- Photoreflectance
- Monochromators
Disciplines
- Physics