Below Band Gap Photoreflectance Transitions in Epitaxial GaN

Phil W. Yu, Jerry D. Clark, David C. Look, C. Q. Chen, Jinwei Yang, Edmundas Koutstis, M. Asif Khan, Denis V. Tsvertkov, Vladimir A. Dmitriev

Research output: Contribution to journalArticlepeer-review

Abstract

A photoreflectance (PR) and photoluminescence (PL) study has been performed on a Si-doped epitaxial GaN layer that contains impurity or defect related below band gap features in its PR spectrum. In the 300 K PR spectrum, these features appear at energies of 3.26 and 3.33 eV, respectively, but below 180 K they can no longer be seen. The 3.26 eV line evidently corresponds to a donor acceptor pair transition, also seen in PL. The origin of the 3.33 eV line is uncertain, but may correspond to a transition involving the nitrogen vacancy.

Original languageAmerican English
Pages (from-to)1931-1933
JournalApplied Physics Letters
Volume85
Issue number11
DOIs
StatePublished - Sep 13 2004

Keywords

  • Doping
  • Excitons
  • Photons
  • Epitaxy
  • Mechanical stress
  • Semiconductor materials
  • Photoluminescence spectroscopy
  • Vapor phase deposition
  • Photoreflectance
  • Monochromators

Disciplines

  • Physics

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