Below Band Gap Photoreflectance Transitions in Epitaxial GaN

  • Phil W. Yu
  • , Jerry D. Clark
  • , David C. Look
  • , C. Q. Chen
  • , Jinwei Yang
  • , Edmundas Koutstis
  • , M. Asif Khan
  • , Denis V. Tsvertkov
  • , Vladimir A. Dmitriev

Research output: Contribution to journalArticlepeer-review

Abstract

A photoreflectance (PR) and photoluminescence (PL) study has been performed on a Si-doped epitaxial GaN layer that contains impurity or defect related below band gap features in its PR spectrum. In the 300 K PR spectrum, these features appear at energies of 3.26 and 3.33 eV, respectively, but below 180 K they can no longer be seen. The 3.26 eV line evidently corresponds to a donor acceptor pair transition, also seen in PL. The origin of the 3.33 eV line is uncertain, but may correspond to a transition involving the nitrogen vacancy.

Original languageAmerican English
Pages (from-to)1931-1933
JournalApplied Physics Letters
Volume85
Issue number11
DOIs
StatePublished - Sep 13 2004

Keywords

  • Doping
  • Excitons
  • Photons
  • Epitaxy
  • Mechanical stress
  • Semiconductor materials
  • Photoluminescence spectroscopy
  • Vapor phase deposition
  • Photoreflectance
  • Monochromators

Disciplines

  • Physics

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