Changes in electrical characteristics associated with degradation of InGaN blue light-emitting diodes

Z. Q. Fang; D. C. Reynolds; D. C. Look

doi:10.1007/s11664-000-0159-4

Changes in electrical characteristics associated with degradation of InGaN blue light-emitting diodes

Z. Q. Fang, D. C. Reynolds, D. C. Look

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	448-451
Number of pages	4
Journal	Journal of Electronic Materials
Volume	29
Issue number	4
DOIs	https://doi.org/10.1007/s11664-000-0159-4
State	Published - Apr 2000

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1007/s11664-000-0159-4

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title = "Changes in electrical characteristics associated with degradation of InGaN blue light-emitting diodes",

author = "Fang, \{Z. Q.\} and Reynolds, \{D. C.\} and Look, \{D. C.\}",

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AU - Reynolds, D. C.

AU - Look, D. C.

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JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 4

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Changes in electrical characteristics associated with degradation of InGaN blue light-emitting diodes

ASJC Scopus Subject Areas

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