@article{80937a8a4e544bc3b2e5635cab47afbe,
title = "Characterization of deep centers in undoped semi-insulating GaAs substrates by normalized thermally stimulated current spectroscopy: Comparison of 100 and 150 mm wafers",
keywords = "Defects, Normalized thermally stimulated current (NTSC) spectroscopy, Semi-insulating (SI) GaAs",
author = "Fang, {Z. Q.} and Look, {D. C.} and Mier, {M. G.}",
year = "1998",
month = feb,
doi = "10.1007/s11664-998-0189-x",
language = "English",
volume = "27",
pages = "62--68",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
number = "2",
}