Critical Comparison of Carrier Lifetime at 1.55 μm of Ion-Irradiated InGaAs, Cold-Implanted InGaAsP, and ErAs:GaAs

M. Martin, E. R. Brown, J. Mangeney, A. Fekecs, R. Ares, D. Morris

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We compare the photocarrier lifetime measured in Br-irradiated InGaAs and cold Fe-implanted InGaAsP. We also demonstrate the possibility of a two-photon absorption (TPA) process in ErAs:GaAs. The lifetime and the TPA were measured with a fiber-based 1550 nm time-resolved differential transmission (?T) set-up. The InGaAs-based materials show a positive ?T with sub-picosecond lifetime, whereas ErAs:GaAs shows a negative ?T consistent with a two-photon absorption process.
Original languageEnglish
Title of host publicationIRMMW-THz 2012 - 37th International Conference on Infrared, Millimeter, and Terahertz Waves
DOIs
StatePublished - 2012
Event37th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2012 - Wollongong, NSW, Australia
Duration: Sep 23 2012Sep 28 2012

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference37th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2012
Country/TerritoryAustralia
CityWollongong, NSW
Period9/23/129/28/12

ASJC Scopus Subject Areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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