@article{d45a68f61c0d4fc8b8a15900dedc790a,
title = "Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices",
keywords = "AlGaN, cathodoluminescence spectroscopy, defect, GaN, high-electron-mobility transistor, hyperspectral imaging, nanowire, SiC, surface photovoltage spectroscopy, Wide-bandgap semiconductor, ZnO",
author = "Brillson, {L. J.} and Foster, {G. M.} and J. Cox and Ruane, {W. T.} and Jarjour, {A. B.} and H. Gao and {von Wenckstern}, H. and M. Grundmann and B. Wang and Look, {D. C.} and A. Hyland and Allen, {M. W.}",
note = "Publisher Copyright: {\textcopyright} 2018, The Minerals, Metals & Materials Society.",
year = "2018",
month = sep,
day = "1",
doi = "10.1007/s11664-018-6214-9",
language = "English",
volume = "47",
pages = "4980--4986",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
number = "9",
}