@article{d45a68f61c0d4fc8b8a15900dedc790a,
title = "Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices",
keywords = "AlGaN, cathodoluminescence spectroscopy, defect, GaN, high-electron-mobility transistor, hyperspectral imaging, nanowire, SiC, surface photovoltage spectroscopy, Wide-bandgap semiconductor, ZnO",
author = "Brillson, \{L. J.\} and Foster, \{G. M.\} and J. Cox and Ruane, \{W. T.\} and Jarjour, \{A. B.\} and H. Gao and \{von Wenckstern\}, H. and M. Grundmann and B. Wang and Look, \{D. C.\} and A. Hyland and Allen, \{M. W.\}",
note = "Publisher Copyright: {\textcopyright} 2018, The Minerals, Metals \& Materials Society.",
year = "2018",
month = sep,
day = "1",
doi = "10.1007/s11664-018-6214-9",
language = "English",
volume = "47",
pages = "4980--4986",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
number = "9",
}