Degenerate layer at GaN/sapphire interface: Influence on Hall-effect measurements

D. C. Look; R. J. Molnar

doi:10.1063/1.119176

Degenerate layer at GaN/sapphire interface: Influence on Hall-effect measurements

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	3377-3379
Number of pages	3
Journal	Applied Physics Letters
Volume	70
Issue number	25
DOIs	https://doi.org/10.1063/1.119176
State	Published - Jun 23 1997

ASJC Scopus Subject Areas

Physics and Astronomy (miscellaneous)

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10.1063/1.119176

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title = "Degenerate layer at GaN/sapphire interface: Influence on Hall-effect measurements",

author = "Look, \{D. C.\} and Molnar, \{R. J.\}",

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AU - Molnar, R. J.

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Degenerate layer at GaN/sapphire interface: Influence on Hall-effect measurements

ASJC Scopus Subject Areas

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