| Original language | English |
|---|---|
| Pages (from-to) | 281-284 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 81 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1 1997 |
ASJC Scopus Subject Areas
- General Physics and Astronomy
Depth measurement of doped semiconductors using the Hall technique
- Gregory C. DeSalvo
- , David C. Look
- , Christopher A. Bozada
- , John L. Ebel
Research output: Contribution to journal › Article › peer-review