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Detection, identification, and impact of native point defects on conduction in ITO thin films

  • Jacob Cowsky
  • , David C. Look
  • , Kevin Leedy
  • , Intuon Chatratin
  • , Anderson Janotti
  • , Oliver Bierwagen
  • , Leonard J. Brillson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number182108
JournalApplied Physics Letters
Volume128
Issue number18
DOIs
StatePublished - May 4 2026

ASJC Scopus Subject Areas

  • Physics and Astronomy (miscellaneous)

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