Development of an automated analyzer for TEM diffraction patterns

A. G. Jackson, J. Park, D. Wood, S. LeClair

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	264-265
Number of pages	2
Journal	Proceedings - Annual Meeting, Microscopy Society of America
State	Published - 1993
Externally published	Yes
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

ASJC Scopus Subject Areas

@article{b2ccbbe6b0a744a298159dd8c1a755e5,

title = "Development of an automated analyzer for TEM diffraction patterns",

author = "Jackson, {A. G.} and J. Park and D. Wood and S. LeClair",

year = "1993",

language = "English",

pages = "264--265",

journal = "Proceedings - Annual Meeting, Microscopy Society of America",

issn = "0424-8201",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - JOUR

T1 - Development of an automated analyzer for TEM diffraction patterns

AU - Jackson, A. G.

AU - Park, J.

AU - Wood, D.

AU - LeClair, S.

PY - 1993

Y1 - 1993

UR - http://www.scopus.com/inward/record.url?scp=0027705638&partnerID=8YFLogxK

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M3 - Conference article

AN - SCOPUS:0027705638

SN - 0424-8201

SP - 264

EP - 265

JO - Proceedings - Annual Meeting, Microscopy Society of America

JF - Proceedings - Annual Meeting, Microscopy Society of America

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -