Development of an Automated Analyzer for TEM Diffraction Patterns

A. G. Jackson, J. Park, D. Wood, S. LeClair

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Pages	264-265
Number of pages	2
State	Published - 1993
Externally published	Yes
Event	51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

Conference	51st Annual Meeting Microscopy Society of America
City	Cincinnati, OH, USA
Period	8/1/93 → 8/6/93

ASJC Scopus Subject Areas

@inproceedings{d760dd3cab2d4b77be74bb47412f3058,

title = "Development of an Automated Analyzer for TEM Diffraction Patterns",

author = "Jackson, \{A. G.\} and J. Park and D. Wood and S. LeClair",

year = "1993",

language = "English",

isbn = " 0424-8201",

pages = "264--265",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

note = "51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - GEN

T1 - Development of an Automated Analyzer for TEM Diffraction Patterns

AU - Jackson, A. G.

AU - Park, J.

AU - Wood, D.

AU - LeClair, S.

PY - 1993

Y1 - 1993

UR - https://www.scopus.com/pages/publications/0027705638

UR - https://www.scopus.com/inward/citedby.url?scp=0027705638&partnerID=8YFLogxK

UR - https://corescholar.libraries.wright.edu/mme/217

M3 - Conference contribution

SN - 0424-8201

SP - 264

EP - 265

BT - Proceedings - Annual Meeting, Microscopy Society of America

T2 - 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -