Direct Measurement of Electron-Diffraction-Pattern Intensities using an Energy Loss Spectrometer

A. G. Jackson, M. Rowe

Research output: Contribution to conferencePresentation

Original languageAmerican English
StatePublished - Jan 1 1989
EventProceedings of the Annual Meeting of the Electron Microscopy Society of America -
Duration: Jan 1 1989 → …

Conference

ConferenceProceedings of the Annual Meeting of the Electron Microscopy Society of America
Period1/1/89 → …

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