Effects of in profile on material and device properties of AlGaAs/InGaAs/GaAs high electron mobility transistors

D. C. Look, B. Jogai, R. Kaspi, J. L. Ebel, K. R. Evans, R. L. Jones, K. Nakano, R. E. Sherriff, C. E. Stutz, G. C. DeSalvo, C. Ito

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)540-544
Number of pages5
JournalJournal of Applied Physics
Volume79
Issue number1
DOIs
StatePublished - Jan 1 1996

ASJC Scopus Subject Areas

  • General Physics and Astronomy

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