Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

Mark J. Yannuzzi; Neil A. Moser; Robert C. Fitch; Gregg H. Jessen; James K. Gillespie; Glen D. Via; Antonio Crespo; Thomas J. Jenkins; David C. Look; Donald C. Reynolds

doi:10.1557/proc-764-c4.2

Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

Mark J. Yannuzzi, Neil A. Moser, Robert C. Fitch, Gregg H. Jessen, James K. Gillespie, Glen D. Via, Antonio Crespo, Thomas J. Jenkins, David C. Look, Donald C. Reynolds

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	305-313
Number of pages	9
Journal	Materials Research Society Symposium - Proceedings
Volume	764
DOIs	https://doi.org/10.1557/proc-764-c4.2
State	Published - 2003
Event	MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS: New Applications for Wide-Bandgap Semiconductors - San Francisco, CA, United States Duration: Apr 22 2003 → Apr 24 2003

ASJC Scopus Subject Areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1557/proc-764-c4.2

Cite this

@article{1355f4bdac1c40d8a1fad17766149589,

title = "Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures",

author = "Yannuzzi, {Mark J.} and Moser, {Neil A.} and Fitch, {Robert C.} and Jessen, {Gregg H.} and Gillespie, {James K.} and Via, {Glen D.} and Antonio Crespo and Jenkins, {Thomas J.} and Look, {David C.} and Reynolds, {Donald C.}",

year = "2003",

doi = "10.1557/proc-764-c4.2",

language = "English",

volume = "764",

pages = "305--313",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

note = "MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS: New Applications for Wide-Bandgap Semiconductors ; Conference date: 22-04-2003 Through 24-04-2003",

}

TY - JOUR

T1 - Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

AU - Yannuzzi, Mark J.

AU - Moser, Neil A.

AU - Fitch, Robert C.

AU - Jessen, Gregg H.

AU - Gillespie, James K.

AU - Via, Glen D.

AU - Crespo, Antonio

AU - Jenkins, Thomas J.

AU - Look, David C.

AU - Reynolds, Donald C.

PY - 2003

Y1 - 2003

UR - http://www.scopus.com/inward/record.url?scp=0344927803&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0344927803&partnerID=8YFLogxK

U2 - 10.1557/proc-764-c4.2

DO - 10.1557/proc-764-c4.2

M3 - Conference article

AN - SCOPUS:0344927803

SN - 0272-9172

VL - 764

SP - 305

EP - 313

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS: New Applications for Wide-Bandgap Semiconductors

Y2 - 22 April 2003 through 24 April 2003

ER -

Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

ASJC Scopus Subject Areas

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