Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

Mark J. Yannuzzi; Neil A. Moser; Robert C. Fitch; Gregg H. Jessen; James K. Gillespie; Glen D. Via; Antonio Crespo; Thomas J. Jenkins; David C. Look; Donald C. Reynolds

doi:10.1557/proc-764-c4.2

Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

Mark J. Yannuzzi
, Neil A. Moser
, Robert C. Fitch
, Gregg H. Jessen
, James K. Gillespie
, Glen D. Via
, Antonio Crespo
, Thomas J. Jenkins
, David C. Look
, Donald C. Reynolds

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	305-313
Number of pages	9
Journal	Materials Research Society Symposium - Proceedings
Volume	764
DOIs	https://doi.org/10.1557/proc-764-c4.2
State	Published - 2003
Event	MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS: New Applications for Wide-Bandgap Semiconductors - San Francisco, CA, United States Duration: Apr 22 2003 → Apr 24 2003

ASJC Scopus Subject Areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1557/proc-764-c4.2

Cite this

@article{1355f4bdac1c40d8a1fad17766149589,

title = "Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures",

author = "Yannuzzi, \{Mark J.\} and Moser, \{Neil A.\} and Fitch, \{Robert C.\} and Jessen, \{Gregg H.\} and Gillespie, \{James K.\} and Via, \{Glen D.\} and Antonio Crespo and Jenkins, \{Thomas J.\} and Look, \{David C.\} and Reynolds, \{Donald C.\}",

year = "2003",

doi = "10.1557/proc-764-c4.2",

language = "English",

volume = "764",

pages = "305--313",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

note = "MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS: New Applications for Wide-Bandgap Semiconductors ; Conference date: 22-04-2003 Through 24-04-2003",

}

TY - JOUR

T1 - Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

AU - Yannuzzi, Mark J.

AU - Moser, Neil A.

AU - Fitch, Robert C.

AU - Jessen, Gregg H.

AU - Gillespie, James K.

AU - Via, Glen D.

AU - Crespo, Antonio

AU - Jenkins, Thomas J.

AU - Look, David C.

AU - Reynolds, Donald C.

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0344927803

UR - https://www.scopus.com/pages/publications/0344927803#tab=citedBy

U2 - 10.1557/proc-764-c4.2

DO - 10.1557/proc-764-c4.2

M3 - Conference article

AN - SCOPUS:0344927803

SN - 0272-9172

VL - 764

SP - 305

EP - 313

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS: New Applications for Wide-Bandgap Semiconductors

Y2 - 22 April 2003 through 24 April 2003

ER -

Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

ASJC Scopus Subject Areas

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