Electrical measurements in GaN: Point defects and dislocations

David C. Look, Zhaoqiang Fang, Laura Polenta

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalMRS Internet Journal of Nitride Semiconductor Research
Volume5
Issue numberSUPPL. 1
DOIs
StatePublished - 2000

ASJC Scopus Subject Areas

  • General Materials Science

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