Electrical profiles in GaN/Al2O3 layers with conductive interface regions

D. C. Look, J. E. Hoelscher, J. L. Brown, G. D. Via

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalMRS Internet Journal of Nitride Semiconductor Research
Volume6
DOIs
StatePublished - 2001

ASJC Scopus Subject Areas

  • General Materials Science

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