Electron beam and optical depth profiling of quasibulk GaN

L. Chernyak; A. Osinsky; G. Nootz; A. Schulte; J. Jasinski; M. Benamara; Z. Liliental-Weber; D. C. Look; R. J. Molnar

doi:10.1063/1.1319530

Electron beam and optical depth profiling of quasibulk GaN

L. Chernyak, A. Osinsky, G. Nootz, A. Schulte, J. Jasinski, M. Benamara, Z. Liliental-Weber, D. C. Look, R. J. Molnar

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2695-2697
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	17
DOIs	https://doi.org/10.1063/1.1319530
State	Published - Oct 23 2000

ASJC Scopus Subject Areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1319530

Cite this

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title = "Electron beam and optical depth profiling of quasibulk GaN",

author = "L. Chernyak and A. Osinsky and G. Nootz and A. Schulte and J. Jasinski and M. Benamara and Z. Liliental-Weber and Look, {D. C.} and Molnar, {R. J.}",

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T1 - Electron beam and optical depth profiling of quasibulk GaN

AU - Chernyak, L.

AU - Osinsky, A.

AU - Nootz, G.

AU - Schulte, A.

AU - Jasinski, J.

AU - Benamara, M.

AU - Liliental-Weber, Z.

AU - Look, D. C.

AU - Molnar, R. J.

PY - 2000/10/23

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U2 - 10.1063/1.1319530

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SP - 2695

EP - 2697

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

ER -

Electron beam and optical depth profiling of quasibulk GaN

ASJC Scopus Subject Areas

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