Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

  • David C. Look
  • , Kevin D. Leedy
  • , Arnold Kiefer
  • , Bruce Claflin
  • , Naho Itagaki
  • , Koichi Matsushima
  • , Iping Suhariadi

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number049801
JournalOptical Engineering
Volume56
Issue number4
DOIs
StatePublished - Apr 4 2017

Disciplines

  • Semiconductor and Optical Materials

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