Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

David C. Look, Kevin D. Leedy, Arnold Kiefer, Bruce Claflin, Naho Itagaki, Koichi Matsushima, Iping Suhariadi

Research output: Contribution to journal › Article › peer-review

Disciplines

@article{e6b134b1786547fea1b0e819cb098d5e,

title = "Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide",

author = "Look, \{David C.\} and Leedy, \{Kevin D.\} and Arnold Kiefer and Bruce Claflin and Naho Itagaki and Koichi Matsushima and Iping Suhariadi",

year = "2017",

month = apr,

day = "4",

doi = "10.1117/1.OE.56.4.049801",

language = "English",

volume = "56",

journal = "Optical Engineering",

issn = "0091-3286",

number = "4",

}

TY - JOUR

T1 - Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

AU - Look, David C.

AU - Leedy, Kevin D.

AU - Kiefer, Arnold

AU - Claflin, Bruce

AU - Itagaki, Naho

AU - Matsushima, Koichi

AU - Suhariadi, Iping

PY - 2017/4/4

Y1 - 2017/4/4

U2 - 10.1117/1.OE.56.4.049801

DO - 10.1117/1.OE.56.4.049801

M3 - Article

SN - 0091-3286

VL - 56

JO - Optical Engineering

JF - Optical Engineering

IS - 4

M1 - 049801

ER -