EVALUATION OF DIE STRESS USING VAN DER PAUW SENSORS

A. K.M. Mian, J. C. Suhling, R. C. Jaeger, B. M. Wilamowski

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationApplications of Experimental Mechanics to Electronic Packaging
PublisherAmerican Society of Mechanical Engineers (ASME)
Pages59-67
Number of pages9
ISBN (Electronic)9780791818503
DOIs
StatePublished - 1997
Externally publishedYes
EventASME 1997 International Mechanical Engineering Congress and Exposition, IMECE 1997 - Applications of Experimental Mechanics to Electronic Packaging - Dallas, United States
Duration: Nov 16 1997Nov 21 1997

Publication series

NameASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
Volume1997-K

Conference

ConferenceASME 1997 International Mechanical Engineering Congress and Exposition, IMECE 1997 - Applications of Experimental Mechanics to Electronic Packaging
Country/TerritoryUnited States
CityDallas
Period11/16/9711/21/97

ASJC Scopus Subject Areas

  • Mechanical Engineering

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