Evaluation of die stress using Van Der Pauw sensors

A. K.M. Mian, J. C. Suhling, R. C. Jaeger, B. M. Wilamowski

Research output: Contribution to journalReview articlepeer-review

Original languageEnglish
Pages (from-to)59-67
Number of pages9
JournalAmerican Society of Mechanical Engineers, Applied Mechanics Division, AMD
Volume226
StatePublished - 1997
Externally publishedYes

ASJC Scopus Subject Areas

  • Mechanical Engineering

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