Abstract
We have determined the nonuniform distribution of the shape-induced magnetic anisotropy field for patterned thin films of Ni-Fe. To do this, we used integrated microstrip structures with different widths on identically patterned Ni-Fe cores to act as probes of the internal magnetic field. We verified the accuracy of the field profiles by comparing them with M-H loop measurements of the magnetic films.
Original language | English |
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Pages (from-to) | 1880-1883 |
Number of pages | 4 |
Journal | IEEE Transactions on Magnetics |
Volume | 43 |
Issue number | 5 |
DOIs | |
State | Published - May 2007 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
Keywords
- Demagnetizing field
- Magnetic microwave devices
- Ni-Fe
- Shape anisotropy
Disciplines
- Electrical and Computer Engineering