Abstract
We have determined the nonuniform distribution of the shape-induced magnetic anisotropy field for patterned thin films of Ni-Fe. To do this, we used integrated microstrip structures with different widths on identically patterned Ni-Fe cores to act as probes of the internal magnetic field. We verified the accuracy of the field profiles by comparing them with M-H loop measurements of the magnetic films.
| Original language | English |
|---|---|
| Pages (from-to) | 1880-1883 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 43 |
| Issue number | 5 |
| DOIs | |
| State | Published - May 2007 |
| Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
Keywords
- Demagnetizing field
- Magnetic microwave devices
- Ni-Fe
- Shape anisotropy
Disciplines
- Electrical and Computer Engineering