Femtosecond versus nanosecond laser machining: Comparison of induced stresses and structural changes in silicon wafers

M. S. Amer, M. A. El-Ashry, L. R. Dosser, K. E. Hix, J. F. Maguire, Bryan Irwin

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)162-167
Number of pages6
JournalApplied Surface Science
Volume242
Issue number1-2
DOIs
StatePublished - Mar 31 2005

ASJC Scopus Subject Areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Keywords

  • Femtosecond laser machining
  • Induced stress
  • Laser machining
  • Micromachining
  • Raman spectroscopy
  • Silicon amorphization

Disciplines

  • Engineering
  • Materials Science and Engineering
  • Mechanical Engineering

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