Femtosecond versus nanosecond laser machining: Comparison of induced stresses and structural changes in silicon wafers

  • M. S. Amer
  • , M. A. El-Ashry
  • , L. R. Dosser
  • , K. E. Hix
  • , J. F. Maguire
  • , Bryan Irwin

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)162-167
Number of pages6
JournalApplied Surface Science
Volume242
Issue number1-2
DOIs
StatePublished - Mar 31 2005
Externally publishedYes

ASJC Scopus Subject Areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Keywords

  • Femtosecond laser machining
  • Induced stress
  • Laser machining
  • Micromachining
  • Raman spectroscopy
  • Silicon amorphization

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