Giant traps associated with extended defects in GaN and SiC

D. C. Look; Z. Q. Fang; A. Krtschil; A. Krost

doi:10.1002/pssc.200460617

Giant traps associated with extended defects in GaN and SiC

D. C. Look, Z. Q. Fang, A. Krtschil, A. Krost

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1039-1046
Number of pages	8
Journal	Physica Status Solidi C: Conferences
Volume	2
Issue number	3
DOIs	https://doi.org/10.1002/pssc.200460617
State	Published - 2005

ASJC Scopus Subject Areas

Condensed Matter Physics

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10.1002/pssc.200460617

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title = "Giant traps associated with extended defects in GaN and SiC",

author = "Look, \{D. C.\} and Fang, \{Z. Q.\} and A. Krtschil and A. Krost",

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AU - Look, D. C.

AU - Fang, Z. Q.

AU - Krtschil, A.

AU - Krost, A.

PY - 2005

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JO - Physica Status Solidi C: Conferences

JF - Physica Status Solidi C: Conferences

IS - 3

ER -

Giant traps associated with extended defects in GaN and SiC

ASJC Scopus Subject Areas

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