Abstract
Zinc Oxide crystals have historically been grown in hydrothermal autoclaves with a basic mineralizer; however, doubts have been raised about the quality of such crystals because they have often exhibited large x-ray rocking curve widths and low photoluminescence (PL) yield with large linewidths. Several ZnO crystals were grown hydrothermally and sliced parallel to the c-plane. This resulted in opposite surfaces (the C+ and C-) exhibiting pronounced chemical and mechanical differences. Different surface treatments were investigated and compared by PL both at room temperature and liquid helium temperatures, and by double axis X-ray rocking curve measurements. The high quality of hydrothermally-grown ZnO is substantiated by the narrow rocking curve widths and sharp PL peaks obtained. A critical factor in obtaining these results was found to be surface preparation.
Original language | English |
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Pages (from-to) | 287-292 |
Journal | MRS Internet Journal of Nitride Semiconductor Research |
Volume | 4 |
Issue number | SUPPL. 1 |
DOIs | |
State | Published - 1999 |
ASJC Scopus Subject Areas
- General Materials Science
Disciplines
- Electronic Devices and Semiconductor Manufacturing