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High quality hydrothermal ZnO crystals

  • M. Suscavage
  • , M. Harris
  • , D. Bliss
  • , P. Yip
  • , S. Q. Wang
  • , D. Schwall
  • , L. Bouthillette
  • , J. Bailey
  • , M. Callahan
  • , D. C. Look
  • , D. C. Reynolds
  • , R. L. Jones
  • , C. W. Litton

Research output: Contribution to journalArticlepeer-review

Abstract

Zinc Oxide crystals have historically been grown in hydrothermal autoclaves with a basic mineralizer; however, doubts have been raised about the quality of such crystals because they have often exhibited large x-ray rocking curve widths and low photoluminescence (PL) yield with large linewidths. Several ZnO crystals were grown hydrothermally and sliced parallel to the c-plane. This resulted in opposite surfaces (the C+ and C-) exhibiting pronounced chemical and mechanical differences. Different surface treatments were investigated and compared by PL both at room temperature and liquid helium temperatures, and by double axis X-ray rocking curve measurements. The high quality of hydrothermally-grown ZnO is substantiated by the narrow rocking curve widths and sharp PL peaks obtained. A critical factor in obtaining these results was found to be surface preparation.
Original languageEnglish
Pages (from-to)287-292
JournalMRS Internet Journal of Nitride Semiconductor Research
Volume4
Issue numberSUPPL. 1
DOIs
StatePublished - 1999

ASJC Scopus Subject Areas

  • General Materials Science

Disciplines

  • Electronic Devices and Semiconductor Manufacturing

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