Identifiability of semiconductor defects from LBIC images

Weifu Fang; Kazufumi Ito

doi:10.1137/0152093

Identifiability of semiconductor defects from LBIC images

Wright State University

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1611-1626
Number of pages	16
Journal	SIAM Journal on Applied Mathematics
Volume	52
Issue number	6
DOIs	https://doi.org/10.1137/0152093
State	Published - Dec 1 1992

ASJC Scopus Subject Areas

Applied Mathematics

Keywords

Identifiability
LBIC
inverse problems
semiconductors

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10.1137/0152093

Identifiability of Semiconductor Defects From LBIC ImagesFinal published version, 1.39 MBLicense: Unspecified

Cite this

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title = "Identifiability of semiconductor defects from LBIC images",

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author = "Weifu Fang and Kazufumi Ito",

year = "1992",

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journal = "SIAM Journal on Applied Mathematics",

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AU - Ito, Kazufumi

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KW - LBIC

KW - inverse problems

KW - semiconductors

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Identifiability of semiconductor defects from LBIC images

ASJC Scopus Subject Areas

Keywords

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