Identifiability of semiconductor defects from LBIC images

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1611-1626
Number of pages	16
Journal	SIAM Journal on Applied Mathematics
Volume	52
Issue number	6
DOIs	https://doi.org/10.1137/0152093
State	Published - 1992

ASJC Scopus Subject Areas

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title = "Identifiability of semiconductor defects from LBIC images",

author = "Weifu Fang and Kazufumi Ito",

year = "1992",

doi = "10.1137/0152093",

language = "English",

volume = "52",

pages = "1611--1626",

journal = "SIAM Journal on Applied Mathematics",

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AU - Fang, Weifu

AU - Ito, Kazufumi

PY - 1992

Y1 - 1992

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U2 - 10.1137/0152093

DO - 10.1137/0152093

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JO - SIAM Journal on Applied Mathematics

JF - SIAM Journal on Applied Mathematics

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ER -