Identification of contact regions in semiconductor transistors by level-set methods

Weifu Fang; Kazufumi Ito

doi:10.1016/S0377-0427(03)00543-0

Identification of contact regions in semiconductor transistors by level-set methods

Wright State University

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	399-410
Number of pages	12
Journal	Journal of Computational and Applied Mathematics
Volume	159
Issue number	2
DOIs	https://doi.org/10.1016/S0377-0427(03)00543-0
State	Published - Oct 15 2003

ASJC Scopus Subject Areas

Computational Mathematics
Applied Mathematics

Keywords

Inverse problem
Level-set methods
Semiconductor

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10.1016/S0377-0427(03)00543-0

Cite this

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title = "Identification of contact regions in semiconductor transistors by level-set methods",

keywords = "Inverse problem, Level-set methods, Semiconductor",

author = "Weifu Fang and Kazufumi Ito",

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AU - Ito, Kazufumi

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KW - Inverse problem

KW - Level-set methods

KW - Semiconductor

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Identification of contact regions in semiconductor transistors by level-set methods

ASJC Scopus Subject Areas

Keywords

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