Identification of Cu-related thermally stimulated current trap in undoped semi-insulating GaAs

Z. Q. Fang, D. C. Look, R. L. Jones

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	L29-L31
Journal	Journal of Electronic Materials
Volume	26
Issue number	12
DOIs	https://doi.org/10.1007/s11664-997-0064-1
State	Published - 1997

ASJC Scopus Subject Areas

@article{a44bc5d65dbd4bd0be50737d4d063ca3,

title = "Identification of Cu-related thermally stimulated current trap in undoped semi-insulating GaAs",

author = "Fang, {Z. Q.} and Look, {D. C.} and Jones, {R. L.}",

year = "1997",

doi = "10.1007/s11664-997-0064-1",

language = "English",

volume = "26",

pages = "L29--L31",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

number = "12",

}

TY - JOUR

T1 - Identification of Cu-related thermally stimulated current trap in undoped semi-insulating GaAs

AU - Fang, Z. Q.

AU - Look, D. C.

AU - Jones, R. L.

PY - 1997

Y1 - 1997

UR - http://www.scopus.com/inward/record.url?scp=0031337776&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031337776&partnerID=8YFLogxK

U2 - 10.1007/s11664-997-0064-1

DO - 10.1007/s11664-997-0064-1

M3 - Article

AN - SCOPUS:0031337776

SN - 0361-5235

VL - 26

SP - L29-L31

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 12

ER -