Identification of Semiconductor Contact Resistivity

Weifu Fang; Stavros Busenberg

Identification of Semiconductor Contact Resistivity

Weifu Fang, Stavros Busenberg

Mathematics and Statistics

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Quarterly of Applied Mathematics
Volume	49
State	Published - Dec 1 1991

Keywords

Computer simulation
Current density
Electircal resitivity
Electric potential
Elliptic equations
Greens function
Logical givens
Method of bisection
Newtons method
Semiconductors

Cite this

@article{0a48c8c2d2f1449eb22997f570bfefd8,

title = "Identification of Semiconductor Contact Resistivity",

keywords = "Computer simulation, Current density, Electircal resitivity, Electric potential, Elliptic equations, Greens function, Logical givens, Method of bisection, Newtons method, Semiconductors",

author = "Weifu Fang and Stavros Busenberg",

year = "1991",

month = dec,

day = "1",

language = "American English",

volume = "49",

journal = "Quarterly of Applied Mathematics",

}

TY - JOUR

T1 - Identification of Semiconductor Contact Resistivity

AU - Fang, Weifu

AU - Busenberg, Stavros

PY - 1991/12/1

Y1 - 1991/12/1

KW - Computer simulation

KW - Current density

KW - Electircal resitivity

KW - Electric potential

KW - Elliptic equations

KW - Greens function

KW - Logical givens

KW - Method of bisection

KW - Newtons method

KW - Semiconductors

UR - https://corescholar.libraries.wright.edu/math/463

M3 - Article

VL - 49

JO - Quarterly of Applied Mathematics

JF - Quarterly of Applied Mathematics

ER -

Identification of Semiconductor Contact Resistivity

Keywords

Other files and links

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