Imaging of edge inactive layer in micro-patterned graphene monolayer

K. Brockdorf, Z. Ji, N. Engel, J. Myers, S. Mou, H. Huang, Y. Zhuang

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)183-186
Number of pages4
JournalMaterials Letters
Volume211
DOIs
StatePublished - Jan 15 2018

ASJC Scopus Subject Areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Keywords

  • Defects
  • Graphene
  • Micro-patterning
  • Raman spectroscopy
  • Scanning microwave microscopy
  • Defects, Graphene, Micro-patterning, Raman spectroscopy, Scanning microwave microscopy

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