Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy

J. W.P. Hsu, D. V. Lang, S. Richter, R. N. Kleiman, A. M. Sergent, D. C. Look, R. J. Molnar

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number3
Pages (from-to)115-122
Number of pages8
JournalJournal of Electronic Materials
Volume30
Issue number3
DOIs
StatePublished - Mar 2001

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

Keywords

  • Compensation
  • GaN/sapphire interface
  • Impurity band
  • Scanning probe microscopy
  • Surface contact potential

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