Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy

  • J. W.P. Hsu
  • , D. V. Lang
  • , S. Richter
  • , R. N. Kleiman
  • , A. M. Sergent
  • , D. C. Look
  • , R. J. Molnar

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number3
Pages (from-to)115-122
Number of pages8
JournalJournal of Electronic Materials
Volume30
Issue number3
DOIs
StatePublished - Mar 2001

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Compensation
  • GaN/sapphire interface
  • Impurity band
  • Scanning probe microscopy
  • Surface contact potential

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