Infrared transmission topography for whole-wafer gallium arsenide materials characterization

M. G. Mier; D. C. Look; D. C. Walters; D. L. Beasley

doi:10.1016/0038-1101(92)90235-5

Infrared transmission topography for whole-wafer gallium arsenide materials characterization

M. G. Mier, D. C. Look, D. C. Walters, D. L. Beasley

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	319-323
Number of pages	5
Journal	Solid-State Electronics
Volume	35
Issue number	3
DOIs	https://doi.org/10.1016/0038-1101(92)90235-5
State	Published - Mar 1992

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

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10.1016/0038-1101(92)90235-5

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@article{0b74ddb50461422abcd5327bd6084700,

title = "Infrared transmission topography for whole-wafer gallium arsenide materials characterization",

author = "Mier, {M. G.} and Look, {D. C.} and Walters, {D. C.} and Beasley, {D. L.}",

year = "1992",

month = mar,

doi = "10.1016/0038-1101(92)90235-5",

language = "English",

volume = "35",

pages = "319--323",

journal = "Solid-State Electronics",

issn = "0038-1101",

number = "3",

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T1 - Infrared transmission topography for whole-wafer gallium arsenide materials characterization

AU - Mier, M. G.

AU - Look, D. C.

AU - Walters, D. C.

AU - Beasley, D. L.

PY - 1992/3

Y1 - 1992/3

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M3 - Article

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VL - 35

SP - 319

EP - 323

JO - Solid-State Electronics

JF - Solid-State Electronics

IS - 3

ER -

Infrared transmission topography for whole-wafer gallium arsenide materials characterization

ASJC Scopus Subject Areas

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