Investigation of laser beam-induced current techniques for heterojunction photodiode characterization

D. A. Redfern; W. Fang; K. Ito; G. Bahir; C. A. Musca; J. M. Dell; L. Faraone

doi:10.1063/1.1993754

Investigation of laser beam-induced current techniques for heterojunction photodiode characterization

D. A. Redfern, W. Fang, K. Ito, G. Bahir, C. A. Musca, J. M. Dell, L. Faraone

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	034501
Journal	Journal of Applied Physics
Volume	98
Issue number	3
DOIs	https://doi.org/10.1063/1.1993754
State	Published - Aug 1 2005
Externally published	Yes

ASJC Scopus Subject Areas

General Physics and Astronomy

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10.1063/1.1993754

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AU - Redfern, D. A.

AU - Fang, W.

AU - Ito, K.

AU - Bahir, G.

AU - Musca, C. A.

AU - Dell, J. M.

AU - Faraone, L.

PY - 2005/8/1

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VL - 98

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 3

M1 - 034501

ER -

Investigation of laser beam-induced current techniques for heterojunction photodiode characterization

ASJC Scopus Subject Areas

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