Layer thickness dependence of strain in GaN grown by HVPE

Gyu Gwang Sim, P. W. Yu, D. C. Reynolds, D. C. Look, Sang Soo Kim, D. Y. Noh

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	171-175
Number of pages	5
Journal	Materials Research Society Symposium - Proceedings
Volume	693
State	Published - 2002
Externally published	Yes

ASJC Scopus Subject Areas

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title = "Layer thickness dependence of strain in GaN grown by HVPE",

author = "Sim, \{Gyu Gwang\} and Yu, \{P. W.\} and Reynolds, \{D. C.\} and Look, \{D. C.\} and Kim, \{Sang Soo\} and Noh, \{D. Y.\}",

year = "2002",

language = "English",

volume = "693",

pages = "171--175",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

}

TY - JOUR

T1 - Layer thickness dependence of strain in GaN grown by HVPE

AU - Sim, Gyu Gwang

AU - Yu, P. W.

AU - Reynolds, D. C.

AU - Look, D. C.

AU - Kim, Sang Soo

AU - Noh, D. Y.

PY - 2002

Y1 - 2002

UR - https://www.scopus.com/pages/publications/0036375758

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M3 - Article

AN - SCOPUS:0036375758

SN - 0272-9172

VL - 693

SP - 171

EP - 175

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

ER -